AAT develops, manufactures, and supports innovative probe card technology that plays a vital role in today's advanced products.
The most widely used type of probe card for wafer probing. It also supports narrow-pitch pad layouts for TEG measurement, logic, and ASIC.
A probe card using high-frequency coaxial cable. The coaxial cable greatly reduces the influence of noise.
A dedicated PCB compatible with Agilent 4071/72 enables 1pA-level measurement. Force lines are covered by guard lines to reduce leakage current on the board.